| 2008‑11 |
Use of Nonvolatile Residue Monitoring in Semi-conductor Water Applications |
David Blackford et al. |
|
| 2008‑11 |
Is Cation Conductivity Monitoring Relevant For Todayﾒs Combined Cycle Power Plant? |
Luis Carvalho, P.E., Thomas James, and William E. Hunter |
The PowerSmith Cogeneration facility is a 120-megawatt (MW) combined cycle, cogeneration plant lo... |
| 2008‑11 |
Use of Nonvolatile Residue Monitoring in Semiconductor Water Applications |
David Blackford, Ph.D. |
Nonvolatile residue (NVR) consists of dissolved inorganic material. NVR is primarily silica (bot... |
| 2008‑04 |
Prediction and Monitoring of Fouling in Recirculating Cooling Water System Heat Exchangers |
Douglas B. DeWitt-Dick and Edward S. Beardwood |
Fouling on the recirculating cooling waterside of heat exchangers costs industry millions of doll... |
| 2006‑08 |
An overview on IX performance, monitoring, and troubleshooting |
Wayne E. Burnahl |
|
| 2005‑11 |
Monitoring membrane separation processes in high-purity water application |
Jim Elliott & Carl Hickman |
|
| 2005‑02 |
TOC monitoring and its significance to the semiconductor, power, steam generation, and pharmaceutical industry |
Anthony C. Bevilacqua et al. |
|
| 2003‑09 |
Reverse osmosis monitoring and troubleshooting basics |
Bill Helman |
|
| 2000‑08 |
Trends in the use of ion chromatography for monitoring high-purity water at semiconductor plants |
Beverly Newton & Kenneth H. Summerville |
|
| 2000‑08 |
Monitoring deionization capacity of an ion exchange system |
David M. Gray |
|
| 1999‑10 |
Radioactivity monitoring and control in high-purity water |
Marco G. Giammarchi |
|
| 1999‑10 |
Portable continuous TOC monitoring in a semiconductor water system |
Doug Bender & Anthony B. Bevilacqua |
|
| 1999‑02 |
Part 1: Evaluation of on-line TOC analyzers for monitoring recycled water in semiconductor processing |
Robert P. Danovan et al. |
|
| 1996‑02 |
Organic material monitoring in demineralized, polished demineralized, and high-purity water |
Monty McCoy |
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