Archive

March 2001

New advantages in the production of ultra-low TOC effluents with virgin resins

By Michael C. Gottlieb & Peter S. Meyers

January 2001

A classical approach to the sizing of polishing UV TOC reducers in high-purity water plants

By Avijit Dey et al.

October 2000

TOC reduction using membrane technology

By Dean Schwarz

October 1999

Portable continuous TOC monitoring in a semiconductor water system

By Doug Bender & Anthony B. Bevilacqua

March 1999

Part 2: Results from the evaluation of on-line TOC analysisers

By Robert P. Danovan et al.

February 1999

Measurements of ultra-low levels of TOC in semiconductor water

By Patrick Gallegos et al.

Part 1: Evaluation of on-line TOC analyzers for monitoring recycled water in semiconductor processing

By Robert P. Danovan et al.

December 1998

The value of chromatographic characterization of TOC in process water plants

By Stefan A. Huber

August 1998

Recent advancements in UV technology yield enhanced TOC reduction performance

By Bakthisaran Srikanth

March 1998

Chromatographic characterization of TOC in process water treatment

By Stefan A. Huber & Michael Gluschke

February 1998

Evaluating on-line TOC analyzers for high-purity water recycle systems

By Robert P. Danovan et al.

February 1997

Measuring TOC to maintain high-purity water

By Karen Clark et al.

October 1996

Organics, TOC, Color, Turbidity, and SDI pretreatment for unit operations

By Susan L. Coulter

April 1995

A second-generation TOC analysis for high-purity water systems

By Paul Melanson & Michael Retzig