Archive
October 2000
September 2000
August 2000
Water reduction in the regeneration of microelectronics ion exchangers
By William A. Bornak
Boron removal from high-purity water by selective ion-exchange
By Dan Wilcox et al.
Solid phase microextraction and GC-MS analysis of trihalomethanes in high-purity water
By Kefei Wang & Samantha Tan
Areas to consider when selecting an EDI system
By Eli Salem
Electrodeionization replaces aging mixed beds serving semiconductor manufacturing
By Benoit Pare & Roy A. Hango
Trends in the use of ion chromatography for monitoring high-purity water at semiconductor plants
By Beverly Newton & Kenneth H. Summerville
Monitoring deionization capacity of an ion exchange system
By David M. Gray
June 2000
Advertisement
Advertisement